In addition to physically attending its PRML 2020 Public Meeting, the conference will be held online. Delegates who are unable to attend the conference due to the outbreak of COVID-19 can choose "remote participation-only" and participate in special online session or video session. For more details, please feel free to contact firstname.lastname@example.org. PRML 2020 would like to provide a safe, productive and well-attended conference atmosphere.
Welcome to the official website of 2020 International Conference on Pattern Recognition and Machine Learning (PRML 2020). PRML is an annual conference which aims to present the latest research and results of scholars and experts related to Pattern Recognition and Machine Learning. This conference provides opportunities for delegates from different areas to exchange new ideas, applications and experiences face to face, to establish business or research relations, and to find global partners for future collaboration. We hope that the conference results in significant contributions to the knowledge base in these scientific fields.
PRML 2020 will be held during July 16-18, 2020 in Sichuan University, Chengdu, China. It features keynote speech, invited speech as well as paper presentation with oral or poster. It is welcomed that scholars and experts from all over the world to submit the papers or register as listener to participate in the conference.
Submitted papers will be peer-reviewed by the reviewers or Technical Committee members. The accepted and registered papers (after it is presented in the conference) will be published in the conference proceedings, which will be indexed by Ei Compendex, Scopus and sent to Thomson Reuters Conference Proceedings Citation Index (ISI Web of Science) for evaluation and potential indexing as well.
Some selected refereed papers describing the state-of the-art topics will be considered for publication in the International Journal of Machine Learning and Computing (IJMLC) (ISSN: 2010-3700) as a Special Issue, which will be indexed by EI (INSPEC, IET), Google Scholar, Crossref, ProQuest, Electronic Journals Library, and DOAJ.